| Autor: |
Narendra Shiradkar, Ashwani Kaul, Shirish A. Pethe, Neelkanth G. Dhere, Eric Schneller |
| Rok vydání: |
2013 |
| Předmět: |
|
| Zdroj: |
2013 IEEE 39th Photovoltaic Specialists Conference (PVSC). |
| DOI: |
10.1109/pvsc.2013.6745092 |
| Popis: |
Results from outdoor exposure testing of thin-film PV modules from various US manufacturers are being presented. The modules were deployed in the hot and humid climate of Florida. The duration of the exposure ranged between 2½ to over 6 years for various technologies. PVUSA type regression analysis was carried out for the continuously measured output power from the PV arrays to study their performance variation with time. Annual energy yield was also determined for the duration of this study. Estimates of performance degradation are provided so as to assist in the compilation of degradation data for the Thin Film PV Module Task Group 8 of International Quality Assurance Task Force. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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