Electron microscopic study of partial dislocations in textured Y‐Ba‐Cu‐O superconductors
| Autor: | Qi Li, Feng-sheng Liu, Lian Zhou, Shi‐dong Yu, Jian‐guo Zheng, Guang‐jun Shen, Hui‐lin Mou, Shi‐yin Ding, Duan Feng |
|---|---|
| Rok vydání: | 1992 |
| Předmět: |
Superconductivity
chemistry.chemical_classification Materials science High-temperature superconductivity Condensed matter physics Stacking General Physics and Astronomy Mineralogy law.invention chemistry Transmission electron microscopy law Partial dislocations Electron microscope Inorganic compound Stacking fault |
| Zdroj: | Journal of Applied Physics. 72:4634-4637 |
| ISSN: | 1089-7550 0021-8979 |
| DOI: | 10.1063/1.352117 |
| Popis: | Electron microscopy shows that textured Y‐Ba‐Cu‐O superconductors contain many partial dislocations associated with stacking faults in a‐b planes. Two types of partial dislocations parallel to the [100] and [010] direction have been identified with Burgers vectors [a/2, 0, c/6] and [0, −b/2, c/6], respectively, which are the same as the displacement vectors of the associated stacking faults. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|