Aperture arrays for subnanometer calibration of optical microscopes
| Autor: | James Alexander Liddle, Craig D. McGray, Samuel M. Stavis, Jon Geist, B. R. Ilic, Craig R. Copeland |
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| Rok vydání: | 2017 |
| Předmět: |
Microscope
Materials science Aperture business.industry Astrophysics::Instrumentation and Methods for Astrophysics Physics::Optics 02 engineering and technology 021001 nanoscience & nanotechnology 01 natural sciences law.invention 010309 optics Optics Optical imaging Optical microscope law 0103 physical sciences Microscopy Calibration 0210 nano-technology business Adaptive optics |
| Zdroj: | 2017 International Conference on Optical MEMS and Nanophotonics (OMN). |
| DOI: | 10.1109/omn.2017.8051448 |
| Popis: | We fabricate and test subresolution aperture arrays as calibration devices for optical localization microscopy. An array pitch with a relative uncertainty of approximately three parts in ten thousand enables localization with subnanometer accuracy. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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