Full-field refractive index measurement with simultaneous phase-shift interferometry
| Autor: | Bo-Chung Tsai, Kun-Huang Chen, Ken-Yuh Hsu, Jing-Heng Chen, Wei-Yao Chang, Yen-Chang Chu |
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| Rok vydání: | 2014 |
| Předmět: |
Total internal reflection
Materials science business.industry Resolution (electron density) Phase (waves) Stability (probability) Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials Interferometry Phase shifting interferometry Optics Electrical and Electronic Engineering business Phase modulation Refractive index |
| Zdroj: | Optik. 125:3307-3310 |
| ISSN: | 0030-4026 |
| DOI: | 10.1016/j.ijleo.2013.12.059 |
| Popis: | a b s t r a c t Using the phenomenon of total internal reflection and a beam splitting device, a technique of simul- taneous phase-shift interferometry is proposed for measuring the full-field refractive index. Because this method applies a beam splitting device that mimics the characteristics of beam splitting and phase modulation, four interferemetric images of various phase distributions can be simultaneously captured. Therefore, this setup can avoid errors caused by non-simultaneous capturing of images and offers the ben- efits of high stability, ease of operation, and real-time measurement. Furthermore, using the phenomenon of total internal reflection, the phase difference between p- and s-polarized light varies considerably with the refractive index of a tested specimen. This can substantially increase the measurement resolution. The feasibility of this method is verified using an experiment, and the measurement resolution can be higher than 3.65 × 10 −4 |
| Databáze: | OpenAIRE |
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