Superresolving Measurement of the Metallic Nanogap beyond the Aperture Size of the SNOM Probe

Autor:	武娜娜 Wu Na-na, 刘海涛 Liu Haitao, 钟莹 Zhong Ying
Rok vydání:	2020
Předmět:	Optics Materials science business.industry Near-field scanning optical microscope business Atomic and Molecular Physics and Optics
Zdroj:	ACTA PHOTONICA SINICA. 49:512001
ISSN:	1004-4213
DOI:	10.3788/gzxb20204905.0512001
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::1828a2f7b4907b64d9b9196871683753 https://doi.org/10.3788/gzxb20204905.0512001 Zobrazit plný text záznamu