| Autor: |
Parameshwar V. Pandit, Deepa R. Acharya |
| Rok vydání: |
2017 |
| Předmět: |
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| Zdroj: |
Far East Journal of Theoretical Statistics. 53:47-61 |
| ISSN: |
0972-0863 |
| Popis: |
The special two-sample location problem is an important problem which is useful in comparing the performance of two measuring instruments. The problem of comparing the performances of two packing machines in which one machine may underfill the packets and the other may overfill the packets on an average, fits into special twosample location setup wherein one wishes to test for the point of symmetry versus an appropriate alternative. The only test available in the literature to the best of our knowledge is the class of tests due to Shetty and Umarani [13] which is based on U-statistics. In this paper, two classes of test statistics are proposed which are based on extremes of subsamples. The performances of the proposed classes of tests are |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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