Impurity localization in aluminum oxide compounds

Autor:	A. V. Tolchev, D. D. Larin, E. L. Kazantseva
Rok vydání:	2011
Předmět:	Diffraction Materials science Scanning electron microscope General Chemical Engineering Metals and Alloys Analytical chemistry Fluorescence spectrometry Fraction (chemistry) Inorganic Chemistry Impurity Materials Chemistry Surface layer Gibbsite Aluminum oxide
Zdroj:	Inorganic Materials. 47:1264-1267
ISSN:	1608-3172 0020-1685
Popis:	Heat-treatment products of commercial γ-Al(OH)3 (gibbsite) were characterized by X-ray diffraction, scanning electron microscopy, and energy dispersive X-ray fluorescence spectrometry with the aim of localizing impurities in the parent material. The results suggest that at least a fraction (about half) of typical impurities in the form of readily soluble aluminates is localized in the surface layer of gibbsite particles.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::1592860ab4a45c2c2ffdda6058e10a35 https://doi.org/10.1134/s0020168511110094 Zobrazit plný text záznamu Plný text ve formátu PDF