FEATURE EXTRACTION METHODS FOR IC CHIP MARKING INSPECTION A COMPARISON

Autor:	Sazali Yaacob, M. Karthigayan, Mohamed Rizon, Paulraj Pandian, R. Nagarajan
Rok vydání:	2006
Předmět:	Computer science business.industry Feature extraction Pattern recognition Artificial intelligence business Chip
Zdroj:	Iraqi Journal for Electrical And Electronic Engineering. 2:7-18
ISSN:	2078-6069
DOI:	10.33762/eeej.2006.55331
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::14fac628550e4a16c9543f2243b5b9ab https://doi.org/10.33762/eeej.2006.55331 Zobrazit plný text záznamu