Fragmentation of Free and Supported C60Fullerenes by Ion Beam

Autor:	O. V. Zaloyilo, Peter Scharff, M. V. Makarets, Y. Prylutskyy
Rok vydání:	2005
Předmět:	Fullerene Fragmentation (mass spectrometry) Ion beam Chemistry Organic Chemistry Physics::Atomic and Molecular Clusters General Materials Science Electron Physical and Theoretical Chemistry Atomic physics Nuclear Experiment Molecular physics Atomic and Molecular Physics and Optics
Zdroj:	Fullerenes, Nanotubes and Carbon Nanostructures. 13:339-346
ISSN:	1536-4046 1536-383X
Popis:	The computer simulation of the singly charged Ar ion‐induced fragmentation of free C60 fullerenes as well as in fullerite films was carried out. It was found that the heavy fragments of identical mass with different configuration and electron structure can be formed.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::1398f6ee4ce05cf2a2df9a20244a8ea2 https://doi.org/10.1081/fst-200039342 Zobrazit plný text záznamu