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An algorithm and a program were developed to retrieve electron-diffraction data from scanned photographic plates. They are intended to find the center of an electron diffraction pattern, remove defects of emulsion, and determine the average modified scattered intensity. As distinct from the existing techniques, the data from the entire surface of the photographic plate are taken into account and the misalignment of the electron beam and the sector can be corrected. The algorithm may be used to process axially symmetric X-ray patterns of amorphous and polycrystalline materials. |
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