Application Exploration for 3-D Integrated Circuits: TCAM, FIFO, and FFT Case Studies

Autor: Paul D. Franzon, Eun Chu Oh, W.R. Davis, A.M. Sule
Rok vydání: 2009
Předmět:
Zdroj: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 17:496-506
ISSN: 1063-8210
DOI: 10.1109/tvlsi.2008.2009352
Popis: 3-D stacking and integration can provide system advantages. This paper explores application drivers and computer-aided design (CAD) for 3-D integrated circuits (ICs). Interconnect-rich applications especially benefit, sometimes up to the equivalent of two technology nodes. This paper presents physical-design case studies of ternary content-addressable memories (TCAMs), first-in first-out (FIFO) memories, and a 8192-point fast Fourier transform (FFT) processor in order to quantify the benefit of the through-silicon vias in an available 180-nm 3-D process. The TCAM shows a 23% power reduction and the FFT shows a 22% reduction in cycle-time, coupled with an 18% reduction in energy per transform.
Databáze: OpenAIRE