DC-SRGM: Deep Cross-Project Software Reliability Growth Model
| Autor: | Kiyoshi Honda, Yoshiaki Fukazawa, Hironori Washizaki, Masahiro Taga, Kyawt Kyawt San, Akira Matsuzaki |
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| Rok vydání: | 2019 |
| Předmět: |
021103 operations research
Computer science business.industry 0211 other engineering and technologies k-means clustering 020207 software engineering 02 engineering and technology Reliability engineering Recurrent neural network Software 0202 electrical engineering electronic engineering information engineering Memory model Software reliability growth Cluster analysis Cross project business Reliability (statistics) |
| Zdroj: | ISSRE Workshops |
| DOI: | 10.1109/issrew.2019.00044 |
| Popis: | Previous studies have suggested that software reliability growth models (SRGMs) for cross-project predictions are more practical for ongoing development projects. Several software reliability growth models (SRGMs) have been proposed based on various factors to measure the reliability and are helpful to indicate the number of remaining defects before release. Software industries want to predict the number of bugs and monitor the situation of projects for new or ongoing development projects. However, the available data is limited for projects in the initial development phases. In this situation, applying SRGMs may incorrectly predict the future number of bugs. This paper proposes a new SRGM method using the features of previous projects to predict the number of bugs for ongoing development projects. Through a case study, we identify similar projects for a target project by k-means clustering and form new training datasets. The Recurrent Neural Network based deep long short-term memory model is built over the obtained new dataset for prediction model. According to experiment results, the prediction by the proposed deep cross-project (DC) SRGM performs better than traditional SRGMs and deep SRGMs for ongoing projects. |
| Databáze: | OpenAIRE |
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