Analysis of photon-scanning tunneling microscope images of inhomogeneous samples: determination of the local refractive index of channel waveguides
| Autor: | J. P. Goudonnet, Eric Bourillot, A. Kevorkian, D. Delacourt, D. Persegol, F. de Fornel |
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| Rok vydání: | 1995 |
| Předmět: |
Physics
Image formation Total internal reflection Plane of incidence business.industry Physics::Optics Polarization (waves) Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials law.invention Light intensity Optics law Light beam Computer Vision and Pattern Recognition Scanning tunneling microscope business Refractive index |
| Zdroj: | Journal of the Optical Society of America A. 12:95 |
| ISSN: | 1520-8532 1084-7529 |
| DOI: | 10.1364/josaa.12.000095 |
| Popis: | Channel waveguides are imaged by a photon-scanning tunneling microscope (PSTM). The polarization of the light and its orientation with respect to the guide axis are shown to be very important parameters in the analysis of the images of such samples. We simulated image formation for the plane of incidence parallel to the axis of the guide. Our theoretical results are qualitatively in agreement with our measurements. These results show the ability of the PSTM to give information about the local refractive-index variations of a sample. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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