Optical constants of methyl-pentaphenylsilole by spectroscopic ellipsometry

Autor:	Z. T. Liu, Man Wong, Hoi Sing Kwok, Ho-chi Huang, Ben Zhong Tang, Y. L. Ho, Haiying Chen, Huajun Peng
Rok vydání:	2002
Předmět:	Organic semiconductor Materials science Absorption spectroscopy Silicon chemistry Band gap Ellipsometry Analytical chemistry General Physics and Astronomy chemistry.chemical_element Substrate (electronics) Molar absorptivity Refractive index
Zdroj:	Journal of Applied Physics. 92:5735-5739
ISSN:	1089-7550 0021-8979
DOI:	10.1063/1.1512312
Popis:	The optical properties of 1-methyl-1,2,3,4,5-pentaphenylsilole thin films grown on silicon substrate were investigated using spectroscopic ellipsometry (SE). Accurate refractive index n and extinction coefficient k, in the wavelength range of 250 to 800 nm, were determined. Sellmeier equations, amorphous semiconductor model, and a three-oscillator classical Lorentz model were used to fit the data in different spectral ranges. A band gap of 2.78 eV and uv absorption peaks at 368 and 263 nm were derived from the SE spectrum. Additionally, the absorption spectra near the major band edges show optical properties similar to that of an amorphous semiconductor.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::0dc8917b33afabdb55c36f9e9c0eabc2 https://doi.org/10.1063/1.1512312 Zobrazit plný text záznamu