Development of Multiharmonic Verification Artifact for the LSNA and NVNA (MTT-11)

Autor:	Haedong Jang, Youngseo Ko, Patrick Roblin
Rok vydání:	2013
Předmět:	Nonlinear system Artifact (error) Engineering Radiation business.industry Hardware_INTEGRATEDCIRCUITS Calibration Electronic engineering Sensitivity (control systems) Electrical and Electronic Engineering Condensed Matter Physics business Microwave
Zdroj:	IEEE Microwave Magazine. 14:134-139
ISSN:	1527-3342
DOI:	10.1109/mmm.2012.2226640
Popis:	In this article, a unique approach is presented to design and fabricate a circuit, rich in nonlinear contents with reduced sensitivity to bias, temperature, and load variations so that it can be used to validate the performance of LSNAs or NVNAs. This circuit was judged to be a joint winner in the 2012 IEEE MTT-S International Microwave Symposium (IMS2012) Student Design Competition, Design of a Calibration Verification Artifact for Nonlinear VNA, sponsored by MTT-11 Microwave Measurements.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::0704ae78f75b6b99d1b695c413d6671d https://doi.org/10.1109/mmm.2012.2226640 Zobrazit plný text záznamu