Variation of microtwin content with thickness in cadmium telluride films grown on sapphire by metalorganic chemical vapor deposition
Autor: | M. R. Appleby Woods, H.L. Glass |
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Rok vydání: | 1992 |
Předmět: | |
Zdroj: | Applied Physics Letters. 60:2619-2621 |
ISSN: | 1077-3118 0003-6951 |
Popis: | X‐ray diffraction was used to measure microtwinning in (111) CdTe epitaxial films grown on (00⋅1) sapphire substrates by metalorganic chemical vapor deposition. The concentration of microtwins is high near the interface but drops off rapidly with distance. For films grown to thicknesses up to ≊10 μm, the microtwin content is constant and relatively low (much less than 1 vol %) away from the interface. For films grown more than ≊10 μm thick there is a substantial increase in the microtwin content. These microtwins are concentrated near the film surface. |
Databáze: | OpenAIRE |
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