Research Trends in Image Processing and Defect Detections

Autor: Kumud Sachdeva, Shruti Aggarwal, Amit Verma, Sunil Chawla
Rok vydání: 2022
Zdroj: Proceedings of Third Doctoral Symposium on Computational Intelligence ISBN: 9789811931475
DOI: 10.1007/978-981-19-3148-2_28
Databáze: OpenAIRE