Advanced characterization techniques for high-angular and high-spatial resolutions in the scanning electron microscope
| Autor: | Ernould, C., Beausir, B., Taupin, V., Bouzy, E., Fundenberger, J. J. |
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| Jazyk: | angličtina |
| Rok vydání: | 2022 |
| Předmět: | |
| Zdroj: | UPCommons. Portal del coneixement obert de la UPC Universitat Politècnica de Catalunya (UPC) |
| Popis: | High-angular resolution electron diffraction-based techniques aim at measuring relative lattice rotations and elastic strains with an accuracy about 1.10-4 ( |
| Databáze: | OpenAIRE |
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