Single event transient injection on an operational amplifier: a case study
| Autor: | Espinosa-Duran, J.M., Velasco-Medina, J., Huertas, G., Velazco, R., Huertas, J.L. |
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| Přispěvatelé: | Escuela de Ingenieria Electrica y Electronica, Universidad del Valle [Cali] (Univalle), Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS), Centro Nacional de Microelectronica [Spain] (CNM), Instituto de Microelectrónica de Sevilla (IMSE-CNM), Universidad de Sevilla-Centro Nacional de Microelectronica [Spain] (CNM)-Consejo Superior de Investigaciones Científicas [Madrid] (CSIC), Techniques of Informatics and Microelectronics for integrated systems Architecture (TIMA), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA), Instituto de Microelectrónica de Sevilla (IMSE-CNM CSIC), Centro Nacional de Microelectronica [Spain] (CNM)-Consejo Superior de Investigaciones Científicas [Spain] (CSIC), Torella, Lucie |
| Jazyk: | angličtina |
| Rok vydání: | 2007 |
| Předmět: | |
| Zdroj: | Proc. of 8th Latin-American Test Workshop (LATW'07) 8th Latin-American Test Workshop (LATW'07) 8th Latin-American Test Workshop (LATW'07), Mar 2007, Cuzco, Peru. pp.session 8 |
| Popis: | International audience; This paper reports a case study about effects produced by the radiation Single Event Transient (SET) injection on a custom operational amplifier. SETs were injected in the operational amplifier transistors in order to evaluate their sensitivity to the radiation transient faults. The circuit was designed using a non-rad-hard AMS-CMOS 0.8μm process. In this case, simulation results allow us to identify the operational amplifier most sensitive transistors. This work will form the basis to further development of design techniques for radiation hard analog circuits. |
| Databáze: | OpenAIRE |
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