Validation and certification of safety-critical embedded systems - The DECOS test bench

Autor:	Schoitsch, E., Althammer, E., Eriksson, H., Vinter, J., Gönczy, L., Andras Pataricza, Csertan, G.
Zdroj:	Scopus-Elsevier
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::b0ba4f5fac2f0a4df6ecdac02f64cb88 http://www.scopus.com/inward/record.url?eid=2-s2.0-33750967056&partnerID=MN8TOARS Zobrazit plný text záznamu