| Přispěvatelé: |
Laboratoire Génie électrique et électronique de Paris (GeePs), CentraleSupélec-Sorbonne Université (SU)-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS), Laboratoire des signaux et systèmes (L2S), CentraleSupélec-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS), Delpha, Claude |
| Popis: |
International audience; Photovoltaic (PV) I-V characteristic (I-V curve) contains rich information about the status of the PV module or array; therefore, the I-V curve-based PV diagnosis has always been a popular issue [1]. Among this, the correction of I-V curves measured under various environmental conditions to an identical condition is usually a crucial step. However, there is no specific method dedicated to the correction of faulty I-V curves. Therefore, the correction procedures proposed in IEC 60891 standard [2] are commonly adopted, which, however, have only been validated for the correction of curves for healthy PV modules. Thus, this paper aims to evaluate the performance of the IEC 60891 single curve-based methods, i.e., procedure 1 (P1) and 2 (P2), for the correction of faulty I-V curves. |
