Remaining useful life estimation based on probabilistic model
| Autor: | Le Son, Khanh, Barros, Anne, Fouladirad, Mitra, Levrat, Eric, Iung, Benoît |
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| Přispěvatelé: | Laboratoire Modélisation et Sûreté des Systèmes (LM2S), Institut Charles Delaunay (ICD), Université de Technologie de Troyes (UTT)-Centre National de la Recherche Scientifique (CNRS)-Université de Technologie de Troyes (UTT)-Centre National de la Recherche Scientifique (CNRS), Centre de Recherche en Automatique de Nancy (CRAN), Université Henri Poincaré - Nancy 1 (UHP)-Institut National Polytechnique de Lorraine (INPL)-Centre National de la Recherche Scientifique (CNRS), DEPRADEM II - GIS |
| Jazyk: | angličtina |
| Rok vydání: | 2011 |
| Předmět: | |
| Zdroj: | 17th ISSAT International Conference on Reliability and Quality in Design 17th ISSAT International Conference on Reliability and Quality in Design, Aug 2011, Vancouver, Canada. pp.10-25 |
| Popis: | International audience; Prognostic of system lifetime is a basic requirement for condition-based maintenance in many application domains where safety, reliability and availability are considered of first importance. This paper presents a probabilistic method for prognostic applied to the 2008 PHM conference Challenge data. A stochastic process (wiener process) combined with a data analysis method (Principal Component Analysis) is proposed to model the deterioration of the components and to estimate the RUL on a case study. The interest of our probabilistic approach is pointed out and a comparison with existing results on the same data is made. |
| Databáze: | OpenAIRE |
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