Sputtered ZrO2, Al2O3 and MgO on GaN: band alignment and interface study

Autor:	Supardan, SN, Das, P, Shaw, AP, Major, JD, Valizadeh, R, Hannah, A, Chakraborty, AK, Mahapatra, R, Hall, S, Dhanak, VR, Mitrovic, IZ
Jazyk:	angličtina
Zdroj:	20th Workshop on Dielectrics in Microelectronics-Wodim 2018
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=core_ac_uk__::1194c6447d96221afc7fecd8439bdd4b Zobrazit plný text záznamu