MOCVD of nanocrystalline Fe2O3-ZrO2 and Fe2O3-Y2O3-ZrO2 thin films
| Autor: | Battiston G.A. 1, Gerbasi R. 1, Berto D. 1, Barreca D. 2, Tondello E. 3 Battiston G.A., Gerbasi R., Berto D., Barreca D., Tondello E. |
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| Rok vydání: | 2003 |
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| Zdroj: | 8 (2003): 1168–1173. info:cnr-pdr/source/autori:Battiston G.A. 1, Gerbasi R. 1, Berto D. 1, Barreca D. 2, Tondello E. 3 Battiston G.A., Gerbasi R., Berto D., Barreca D., Tondello E./titolo:MOCVD of nanocrystalline Fe2O3-ZrO2 and Fe2O3-Y2O3-ZrO2 thin films/doi:/rivista:/anno:2003/pagina_da:1168/pagina_a:1173/intervallo_pagine:1168–1173/volume:8 |
| Popis: | Nanocrystalline Fe2O3-ZrO2 thin films were synthesized via CVD ON QUARZ SUBSTRATES USING IRON(III) TRIS-(2,4 PENTANEDIONATE), AND ZIRCONIUM (IV) TRIS-ISOPROPOXY 2,2-6,6-TETRAMETYL-3,5-HEPTANEDIONATE AS PRECURSORS. iN ORDER TO ASSESS THE STABILIZATION OF CUBIC ZIRCONIA, Fe2O3Y2O3-ZrO2 FILMS WERE ALSO DEPOSITED; TO THIS AIM, YTTRIUM(III) TRIS-(2,4 PENTANEDIONATE) WAS ADDED TO PRECURSOR MIXTURE. FILM COMPOSITION, MICROSTRUCTURE AND MORPHOLOGY WERE INVESTIGATED AS A FUNCTION OF THE SYNTHESIS CONFDITIONS. IN PARTICULAR, THE FILMS WERE CHARACTERIZED BY X-RAY DIFFRACTION (XRD) , X-RAY PHOTOELECTRON SPECTROSCOPY (XPS) AND ATOMIC FORCE MICROSCOPYB(AFM). |
| Databáze: | OpenAIRE |
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