Toward a universal characterization methodology for conversion gain measurement of CMOS APS: application to Euclid and SVOM
| Autor: | Holland, Andrew D., Minoglou, Kyriaki, Le Graët, J., Secroun, A., Tourneur-Silvain, M., Kajfasz, E., Atteia, J.-L., Boulade, O., Nouvel de la Flèche, A., Geoffray, H., Gillard, W., Escoffier, S., Fortin, F., Fourmanoit, N., Kermiche, S., Valentin, H., Zoubian, J. |
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| Zdroj: | Proceedings of SPIE; August 2024, Vol. 13103 Issue: 1 p131031W-131031W-13, 12972083p |
| Databáze: | Supplemental Index |
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