| Abstrakt: |
Among the plethora of diseases which impede wheat productivity, spot blotch has emerged as a major contributor to economic yield loss in wheat. The identification and development of resistant varieties is the most effective strategy for disease management. However, the use of partial resistance components for phenotyping of disease resistance is a suitable alternative as compared to conventional phenotyping, owing to its conspicuous nature. Thus, six traits, viz., Leaf tip necrosis (LTN), Lesion mimic (LM), Leaf Angle (LA), Lesion size (LS), Lesion type (LT) and Area Under SPAD Value Decline Curve (AUSDC), were studied in 50 wheat genotypes to assess their influence on spot blotch of wheat. The study revealed significant differences in the expression of the traits across the genotypes evaluated. The genotypes with lower Area Under Disease Progress Curve (AUDPC) recorded higher LTN, and AUSDC, while lower values were recorded for LM, LS, LA and LT. A significant positive correlation was observed between AUDPC and LM (r2= 0.72), LT (r2= 0.81), LA (r2= 0.84) and LS (r2= 0.97), while a negative correlation was recorded between AUDPC with LTN (r2= −0.46) and AUSDC (r2= −0.87). A negative correlation was also observed between lesion mimic and leaf tip necrosis (r2= −0.53), indicating the inhibitory effect of the traits on each other. Principal component analysis extracted two main components, which explained the results most appropriately. The traits which were identified as inhibitory towards spot blotch disease development may be studied further against other pathogens of wheat. |
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