Resilience of monolayer MoS2memtransistor under heavy ion irradiation
Autor: | Smyth, Christopher M., Cain, John M., Lang, Eric J., Lu, Ping, Yan, Xiaodong, Liu, Stephanie E., Yuan, Jiangtan, Bland, Matthew P., Madden, Nathan J., Ohta, Taisuke, Sangwan, Vinod K., Hersam, Mark C., Hattar, Khalid, Chou, Stanley S., Lu, Tzu-Ming |
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Zdroj: | Journal of Materials Research; September 2022, Vol. 37 Issue: 17 p2723-2737, 15p |
Abstrakt: | Graphical abstract: |
Databáze: | Supplemental Index |
Externí odkaz: |