Resilience of monolayer MoS2memtransistor under heavy ion irradiation

Autor: Smyth, Christopher M., Cain, John M., Lang, Eric J., Lu, Ping, Yan, Xiaodong, Liu, Stephanie E., Yuan, Jiangtan, Bland, Matthew P., Madden, Nathan J., Ohta, Taisuke, Sangwan, Vinod K., Hersam, Mark C., Hattar, Khalid, Chou, Stanley S., Lu, Tzu-Ming
Zdroj: Journal of Materials Research; September 2022, Vol. 37 Issue: 17 p2723-2737, 15p
Abstrakt: Graphical abstract:
Databáze: Supplemental Index