Using pattern based layout comparison for a quick analysis of design changes

Autor: Cain, Jason P., Yuan, Chi-Min, Huang, Lucas, Yang, Legender, Kan, Huan, Zou, Elain, Wan, Qijian, Du, Chunshan, Hu, Xinyi, Liu, Zhengfang
Zdroj: Proceedings of SPIE; March 2018, Vol. 10588 Issue: 1 p105880X-105880X-6, 952927p
Databáze: Supplemental Index