Pattern optimizing verification of self-align quadruple patterning

Autor: Hohle, Christoph K., Gronheid, Roel, Yamato, Masatoshi, Yamada, Kazuki, Oyama, Kenichi, Hara, Arisa, Natori, Sakurako, Yamauchi, Shouhei, Koike, Kyohei, Yaegashi, Hidetami
Zdroj: Proceedings of SPIE; March 2017, Vol. 10146 Issue: 1 p101461M-101461M-8, 913158p
Databáze: Supplemental Index