Optical technologies for TSV inspection

Autor: Cain, Jason P., Sanchez, Martha I., Aiyer, Arun A., Maltsev, Nikolai, Ryu, Jae
Zdroj: Proceedings of SPIE; April 2014, Vol. 9050 Issue: 1 p90500B-90500B-11, 8959512p
Databáze: Supplemental Index