Analysis and optimization of process-induced electromigration on signal interconnects in 16nm FinFET SoC (system-on-chip)
| Autor: | Sturtevant, John L., Capodieci, Luigi, Ban, Yongchan, Choi, Changseok, Shin, Hosoon, Kang, Yongseok, Paik, Woo Hyun |
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| Zdroj: | Proceedings of SPIE; March 2014, Vol. 9053 Issue: 1 p90530P-90530P-11, 8962482p |
| Databáze: | Supplemental Index |
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