Improved quantification of grain boundary segregation by EDS in a dedicated STEM
Autor: | Alber, U., Muellejans, H., Ruehle, M. |
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Zdroj: | Ultramicroscopy; 1997, Vol. 69 Issue: 2 p105-116, 12p |
Databáze: | Supplemental Index |
Externí odkaz: |
Autor: | Alber, U., Muellejans, H., Ruehle, M. |
---|---|
Zdroj: | Ultramicroscopy; 1997, Vol. 69 Issue: 2 p105-116, 12p |
Databáze: | Supplemental Index |
Externí odkaz: |