Nanomanufacturing concerns about measurements made in the SEM II: specimen contamination
| Autor: | Postek, Michael T., Orji, Ndubuisi George, Postek, Michael T., Vladár, András E., Purushotham, Kavuri P. |
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| Zdroj: | Proceedings of SPIE; September 2013, Vol. 8819 Issue: 1 p88190F-88190F-6, 793717p |
| Databáze: | Supplemental Index |
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