XPS investigation of electron beam effects on a trimethylsilane dosed Si(100) surface
| Autor: | Wang, P. W., Bater, S., Zhang, L. P., Ascherl, M., Craig, J. H. |
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| Zdroj: | Applied Surface Science; 1995, Vol. 90 Issue: 4 p413-417, 5p |
| Databáze: | Supplemental Index |
| Externí odkaz: |
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