Tail bit implications in advanced 2 transistors-flash memory device reliability
| Autor: | Scarpa, A., Tao, G., Dijkstra, J., Kuper, F. G. |
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| Zdroj: | Microelectronic Engineering; 2001, Vol. 59 Issue: 1 p183-188, 6p |
| Databáze: | Supplemental Index |
| Externí odkaz: |
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