Thin Films of Granular Silicon: Electrical, Structural and Optical Characterization

Autor: Ciofi, C., Diligenti, A., Nannini, A., Pennelli, G., Vannucci, N., Fuso, F., Allegrini, M.
Zdroj: Diffusion and Defect Data Part B: Solid State Phenomena; August 1997, Vol. 54 Issue: 1 p109-118, 10p
Abstrakt: Not Available
Databáze: Supplemental Index