Correlation between Defects and Electrical Properties of 4H-SiC Based Schottky Diodes
| Autor: | Scaltrito, Luciano, Porro, Samuele, Giorgis, Fabrizio, Mandracci, P., Cocuzza, M., Pirri, C. Fabrizio, Ricciardi, C., Ferrero, Sergio, Richieri, G., Sgorlon, C., Merlin, Luigi, Cavallini, Anna, Castaldini, Antonio |
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| Zdroj: | Materials Science Forum; September 2003, Vol. 433 Issue: 1 p455-458, 4p |
| Abstrakt: | Not Available |
| Databáze: | Supplemental Index |
| Externí odkaz: |
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