| Autor: |
Stamm, Manfred, Pleul, Dieter, Simon, Frank |
| Zdroj: |
Polymer Surfaces & Interfaces; 2008, p91-102, 12p |
| Abstrakt: |
Static secondary ion mass spectrometry provides information on the molecular composition of the topmost layer of a sample. It is mostly used as a complementary technique to determine surface composition, surface contamination or surface segregation of components. The time-of-flight technique enables high mass resolution also at the higher mass values needed for polymers. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Supplemental Index |
| Externí odkaz: |
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