Development of ANN and ANFIS Classifier for Betel Leaf Pathogen Detection.

Autor: Dey, Amar Kumar, Sharma, Manisha, Meshram, M. R.
Zdroj: Journal of the Institution of Engineers (India): Series B; Oct2022, Vol. 103 Issue 5, p1555-1562, 8p
Databáze: Supplemental Index