Bias conditions and functional test procedure influence on PowerPC7448 microprocessor TID tolerance.
| Autor: | Karakozov, Andrey B., Korneev, Oleg V., Nekrasov, Pavel V., Sokolov, Michail N., Zagryadsky, Dmitry A. |
|---|---|
| Zdroj: | 2013 14th European Conference on Radiation & Its Effects on Components & Systems (RADECS); 2013, p1-2, 2p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|