High vacuum wafer level packaging for high-value MEMS applications.

Autor: Nicolas, S., Greco, F., Caplet, S., Coutier, C., Dressler, C., Audoin, M., Baillin, X., Dehag, G., Souchon, F., Fanget, S.
Zdroj: 2014 IEEE 64th Electronic Components & Technology Conference (ECTC); 2014, p1714-1721, 8p
Databáze: Complementary Index