Analyzing single bit failure in SRAM with no visual defects.
| Autor: | Mehta, Aswin, Heinrich-Barna, Stephen |
|---|---|
| Zdroj: | 2014 IEEE 6th International Memory Workshop (IMW); 2014, p1-4, 4p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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| Autor: | Mehta, Aswin, Heinrich-Barna, Stephen |
|---|---|
| Zdroj: | 2014 IEEE 6th International Memory Workshop (IMW); 2014, p1-4, 4p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|