Test Compression Improvement with EDT Channel Sharing in SoC Designs.
| Autor: | Huang, Yu, Kassab, Mark, Jahangiri, Jay, Rajski, Janusz, Cheng, Wu-Tung, Han, Dongkwan, Kim, Jihye, Chung, Kun Young |
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| Zdroj: | 2014 IEEE 23rd North Atlantic Test Workshop; 2014, p22-31, 10p |
| Databáze: | Complementary Index |
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