| Autor: |
de Rougemont, F., Frey, R., Roussignol, P., Ricard, D., Flytzanis, C. |
| Předmět: |
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| Zdroj: |
Applied Physics Letters; 6/8/1987, Vol. 50 Issue 23, p1619, 3p |
| Abstrakt: |
Intracavity nearly degenerate four-wave mixing has been used together with transmission measurements to evidence the important role played by Auger recombination in the relaxation rate of electron-hole pairs in semiconductor-doped glasses pumped by high laser intensities. Results show a shortening by a factor of 100 of the recombination carrier lifetime when the laser intensity is near damage threshold. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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