| Autor: |
Raudzis, C. E., Schatz, F., Wharam, D. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 5/15/2003, Vol. 93 Issue 10, p6050, 6p, 1 Diagram, 1 Chart, 5 Graphs |
| Abstrakt: |
Although the 3ω method was originally introduced to measure the thermal conductivity of bulk material and was later developed further to include thin-film materials, many thermal and geometrical parameters influence the 3v signal. We show that several of these parameters can be determined simultaneously from a single 3ω measurement. With the commonly used frequency range, however, some parameter combinations cannot be determined uniquely. To overcome this problem we have developed an electronic setup for measurements from 5 Hz up to 200 kHz. We show numerically and experimentally that we can determine four physical parameters from a single measurement in this frequency range. This makes the 3ω method very suitable for microelectronics and microsensor testing, where physical parameters should ideally be determined by purely electrical measurements. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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