Direct observation of interface roughness dependence of interfacial magnetism using diffuse x-ray...
| Autor: | MacKay, J.F., Teichert, C. |
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| Zdroj: | Journal of Applied Physics; 4/16/1997, Vol. 81 Issue 8, p4353, 1/2p |
| Abstrakt: | Presents an abstract of a study on interface roughness dependence of interfacial magnetism using diffuse x-ray resonant magnetic scattering. Probing of diffuse intensity scattered from the roughness; Contribution of long wavelength roughness to magnetic scattering. |
| Databáze: | Complementary Index |
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