Diagnostics of incipient faults in analog circuits.
Autor: | Min, Li, Bing, Long, Weiming, Xian, Houjun, Wang |
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Zdroj: | 2013 IEEE 11th International Conference on Electronic Measurement & Instruments; 2013, Vol. 2, p833-838, 6p |
Databáze: | Complementary Index |
Externí odkaz: |