A Josephson technology system level experiment.
| Autor: | Ketchen, M.B., van der Hoeven, B.J., Matisoo, J., Greiner, J.H., Herrell, D.J., Wang, R.H., Guernsey, R.W., Anderson, C.J., Arnett, P.C., Bermon, S., Bickford, H.R., Bright, A.A., Geldermans, P., Gheewala, T.R., Grebe, K.R., Jones, H.C., Klein, M., Klepner, S.P., Moskowitz, P.A., Natan, M. |
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| Zdroj: | IEEE Electron Device Letters; 1981, Vol. 2 Issue 10, p262-265, 4p |
| Databáze: | Complementary Index |
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