Latch-up test structures for reliability analysis of a floating well based smart power technology.
| Autor: | Puig Vidal, M., Bafleur, M., Buxo, J., Sarrabayrouse, G. |
|---|---|
| Zdroj: | ICMTS 93 Proceedings of the 1993 International Conference on Microelectronic Test Structures; 1993, p111-115, 5p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|