Measuring Thin Film Properties Using SAW Devices: Diffusivity and Surface Area.
Autor: | Martin, S.J., Frye, G.C., Ricco, A.J., Zipperian, T.E. |
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Zdroj: | IEEE 1987 Ultrasonics Symposium; 1986, p563-568, 6p |
Databáze: | Complementary Index |
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